KOEHLER K47910 Benchtop EDXRF Elemental Analyzer

Software
• Qualitative and Quantitative Analysis
• Normalization and Validation Feature
• Fundamental Parameters
• Data Export Function with LIMS compatibility
• User Selectable Shaping Times
• Simple Flow Bar Wizard to create new applications
• Icon Driven Graphical User Interface
• Password Protection

Specifications 
Conforms to the specifications of:
ASTM D4294, D5059, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1
Excitation: 
50 kV X-Ray Tube
4W Maximum Power
6 Tube Filter Positions with Optics
Spill/Contamination Protection
Detection: 
High Performance Silicon Drift Semiconductor Detector
Peltier Thermo-Electric Cooling
High Spectral Resolution and Count Rate
Detection Limits (LLD):
Sulfur: 2 ppm in Air (1.3 ppm in He)
Nickel: 1.5 ppm
Vanadium: 0.6 ppm
Lead: 0.0003 g/L
Sample Chamber: 
Large 190 x 165 x 60 mm sample chamber
Single Position 32 mm sample aperture
Single Position 40 mm sample aperture
Bulk Sample Aperture
User Interface:
8” WVGA Touch Screen Interface
Embedded Computer
Internal Thermal Printer
USB & Ethernet Connections
Environmental Conditions:
Ambient Temperatures 10 - 35°C (50 - 95°F)
Relative Humidity < 85% non-condensing
Vibration undetectable by human
Free from corrosive gas, dust, and particles
Electrical Requirements:
100/240V, 1.4A, 50/60Hz
Single Phase AC

Dimensions wxdxh,in.(cm)
13 x 17 x 14.8 (33.1 x 43.2 x 37.6)
Net Weight: 35 lbs (16 kg)